Title :
Testing reversible adder/subtractor for missing control points
Author :
Sultana, Shabana ; Radecka, Katarzyna
Author_Institution :
Dept. of Electr. & Comput. Eng., McGill Univ., Montreal, QC, Canada
Abstract :
Testing reversible circuits is a challenging issue. A commonly used technology related fault model in reversible gate is missing control points of reversible gates. In this paper we address this type of fault in reversible adder/subtractor circuit and present an efficient way to detect and identify the location of the faults. The regular structure of adder/subtractor facilitates the testing of such circuits and we show that only three test vectors are sufficient to test for n-bit adder/subtractor with 100% fault coverage. Moreover, with proper sequence of input test vectors it is possible to find the fault location.
Keywords :
adders; circuit testing; fault location; logic gates; logic testing; vectors; fault location identification; input test vector; missing control point; reversible adder-subtractor circuit testing; reversible gate;
Conference_Titel :
Circuits and Systems (MWSCAS), 2013 IEEE 56th International Midwest Symposium on
Conference_Location :
Columbus, OH
DOI :
10.1109/MWSCAS.2013.6674673