• DocumentCode
    649340
  • Title

    A 2.6V Silicon-on Sapphire CMOS current imbalance sensing circuit for neurostimulation applications

  • Author

    Rodrigues, C.R.L. ; Lehmann, T. ; Das, Krishanu ; Suaning, Gregg

  • Author_Institution
    Gmicro - Center of Technol., Fed. Univ. of Santa Maria, Santa Maria, Brazil
  • fYear
    2013
  • fDate
    4-7 Aug. 2013
  • Firstpage
    971
  • Lastpage
    974
  • Abstract
    The occurrence of charge imbalance during the electrical stimulation of neurons has potential for destroying electrodes and damaging cells, which may lead ultimately to the stimulator explantation. In a measurement approach, imbalance can be treated as a DC component of the stimulation current. In this paper, we introduce a circuit solution suitable for measuring DC components associated with stimulation imbalances when voltage swings over three or more times the maximum voltage supply for the technology (3.3V). The proposed topology uses a current mirror connected in series to the stimulator to charge sampling capacitors, isolating the readout input from the high voltage (HV) stimulator output. The circuit was designed for Silanna Silicon-on-Sapphire 0.5μm/FC process, and has two operation modes: continuous integration (or charge sensing, for low stimulation currents), or instant error sampling. Simulation results indicates that the technique is suitable for detecting imbalances <;100nA for a milliampere stimulation current.
  • Keywords
    CMOS integrated circuits; biosensors; current mirrors; elemental semiconductors; integrated circuit design; silicon-on-insulator; Al2O3-Si; DC components; charge imbalance; current mirror; high voltage stimulator output; instant error sampling; neurostimulation applications; sampling capacitors; silicon on sapphire CMOS current imbalance sensing circuit; voltage 2.6 V; voltage 3.3 V;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems (MWSCAS), 2013 IEEE 56th International Midwest Symposium on
  • Conference_Location
    Columbus, OH
  • ISSN
    1548-3746
  • Type

    conf

  • DOI
    10.1109/MWSCAS.2013.6674813
  • Filename
    6674813