DocumentCode :
649355
Title :
Phase-noise tuneable ring voltage-controlled oscillator in 90 nm CMOS
Author :
Behbahani, Majid ; Cowan, Glenn E. R.
Author_Institution :
Ericsson Canada Inc., Montreal, QC, Canada
fYear :
2013
fDate :
4-7 Aug. 2013
Firstpage :
1031
Lastpage :
1034
Abstract :
An architecture that compensates the sensitivity to process variation of the phase-noise performance of a ring voltage-controlled oscillator (VCO) is presented. The architecture consists of a VCO subdivided into 10, individually activated sub-VCOs whose outputs are connected together through pass-transistor switches. By varying the number of active sub-VCOs, per-die tuning of phase noise and power dissipation is enabled. Monte-Carlo simulations in ST 90 nm CMOS show a 36 % reduction in the worst case and 41 % reduction in the average power dissipation of a design required to satisfy the same phase-noise specification. Measured results show that phase noise can be traded-off against power dissipation on a per-die basis. The technique is also applicable to multi-rate wireline systems in which different data rates require different jitter specifications.
Keywords :
CMOS integrated circuits; phase noise; voltage-controlled oscillators; CMOS integrated circuit; Monte-Carlo simulation; pass transistor switch; per die basis; phase noise performance; phase noise tuneable voltage controlled oscillator; power dissipation; ring voltage controlled oscillator; size 90 nm;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems (MWSCAS), 2013 IEEE 56th International Midwest Symposium on
Conference_Location :
Columbus, OH
ISSN :
1548-3746
Type :
conf
DOI :
10.1109/MWSCAS.2013.6674828
Filename :
6674828
Link To Document :
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