Title :
Outage performance analysis of basic receive diversity combining schemes in Nakagami-0.5 fading channel
Author :
Pamula, Vinay K. ; Khan, Haidar ; Vempati, S.R. ; Tipparti, A.K.
Author_Institution :
Dept. of ECE, JNTUK, Kakinada, India
Abstract :
This paper presents a study on the outage performance analysis of basic receive diversity combining schemes in terms of outage probability and average outage duration over Nakagami-0.5 fading channels. Recent attention has been given to Nakagami-0.5 fading channel as a special case of Nakakgami-m fading channel with m = 0.5 and as a worst-case (severe) fading scenario. Closed-form expressions for outage probability and average outage duration are derived for selection combining (SC), equal gain combining (EGC) and maximal-ratio combining (MRC) diversity schemes. The expressions derived are numerically evaluated to study the effect of diversity order and multipath intensity profile (MIP) on the system performance.
Keywords :
Nakagami channels; fading channels; multipath channels; probability; EGC; MIP; MRC; Nakagami channel; SC; closed form expressions; equal gain combining; fading channel; maximal ratio combining; multipath intensity profile; outage duration; outage performance analysis; outage probability; selection combining;
Conference_Titel :
Circuits and Systems (MWSCAS), 2013 IEEE 56th International Midwest Symposium on
Conference_Location :
Columbus, OH
DOI :
10.1109/MWSCAS.2013.6674878