• DocumentCode
    649549
  • Title

    Thermal conductivity of isotopically enriched silicon carbide

  • Author

    Lundqvist, Bjorn ; Raad, Patrick ; Yazdanfar, Milan ; Stenberg, Petri ; Liljedahl, Rickard ; Komarov, Pavel ; Rorsman, Niklas ; Ager, J. ; Kordina, Olle ; Ivanov, Ivan ; Janzen, E.

  • Author_Institution
    Linkoping Univ., Linkoping, Sweden
  • fYear
    2013
  • fDate
    25-27 Sept. 2013
  • Firstpage
    58
  • Lastpage
    61
  • Abstract
    Since the semiconductor silicon carbide presents attractive opportunities for the fabrication of novel electronic devices, there is significant interest in improving its material quality. Shrinking component sizes and high demands for efficiency and reliability make the capability to release excess heat an important factor for further development. Experience from Si and Diamond tells us that isotopic enrichment is a possible way to increase the thermal conductivity. We have produced samples of 4H-SiC that contain 28Si and 12C to a purity of 99.5%. The thermal conductivity in the c-direction of these samples has been measured by a transient thermoreflectance method. An improvement due to enrichment of at least 18% was found. The result is valid for a temperature of 45K above room temperature. A preliminary study of the temperature dependence of the thermal conductivity demonstrates a strong temperature dependence in agreement with earlier reports for 4H.
  • Keywords
    silicon compounds; thermal conductivity; thermoreflectance; wide band gap semiconductors; SiC; diamond; electronic devices; semiconductor silicon carbide; temperature 45 K; thermal conductivity; transient thermoreflectance method;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Thermal Investigations of ICs and Systems (THERMINIC), 2013 19th International Workshop on
  • Conference_Location
    Berlin
  • Print_ISBN
    978-1-4799-2271-0
  • Type

    conf

  • DOI
    10.1109/THERMINIC.2013.6675243
  • Filename
    6675243