• DocumentCode
    649999
  • Title

    Generalized admittance matrix model of fully-differential VCVS

  • Author

    Sanchez-Lopez, C.

  • Author_Institution
    Dept. of Electron., Autonomous Univ. of Tlaxcala, Tlaxcala, Mexico
  • fYear
    2013
  • fDate
    Sept. 30 2013-Oct. 4 2013
  • Firstpage
    449
  • Lastpage
    452
  • Abstract
    This paper proposes a new admittance matrix model to approach the behavior of a fully-differential voltage controlled voltage source at low-frequency. The new model is simpler than that reported in the literature, because it not only can directly be used to fill the admittance matrix without extra variables, including gain and input-output impedances, but also the new stamp has few nonzero elements. Our results indicate that the proposed model can directly be used into a standard nodal analysis, obtaining a reduced and sparse system of equations. Two analysis examples are provided, showing that fully-symbolic transfer functions of a single-ended and balanced differential amplifier can be computed by using nodal analysis. But even, the symbolic expression of the common-mode rejection ratio of the differential amplifier is also computed. As a consequence, the computational complexity during the solution of the system of equations is reduced when recursive determinant-expansion techniques are applied.
  • Keywords
    computational complexity; differential amplifiers; transfer functions; voltage control; balanced differential amplifier; common-mode rejection ratio; computational complexity; fully-differential VCVS; fully-symbolic transfer functions; generalized admittance matrix; low-frequency; nonzero elements; single-ended differential amplifier; standard nodal analysis; symbolic expression; voltage controlled voltage source; Nodal analysis; commoun-mode rejection ratio; controlled sources; nullor; operational amplifier; symbolic analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Engineering, Computing Science and Automatic Control (CCE), 2013 10th International Conference on
  • Conference_Location
    Mexico City
  • Print_ISBN
    978-1-4799-1460-9
  • Type

    conf

  • DOI
    10.1109/ICEEE.2013.6676030
  • Filename
    6676030