DocumentCode :
650248
Title :
Design of capacitance measurement circuit for data acquisition system ECVT
Author :
Yusuf, Arbai ; Widada, Wahyu ; Taruno, Warsito P.
Author_Institution :
CTECH Labs., Center for Tomography Res. Edwar Technol. Co., Tangerang, Indonesia
fYear :
2013
fDate :
7-8 Oct. 2013
Firstpage :
444
Lastpage :
448
Abstract :
In this research, we proposed a capacitance measurement circuit Electrical Capacitance Volume Tomography (ECVT) to perform three-dimensional image visualization. The ECVT system is consists of three main parts i.e. sensor, data acquisition system, and computer. Data acquisition system is composed of capacitance measurement circuit and microcontroller to measure an unknown capacitance inside the sensor, collect data and send it to the computer. Further, these data is used to reconstruct 3D image. The design of the circuit used a sine wave 14.6 Vp-p and 2.5 MHz of frequency injected to the electrode pair to measure an unknown capacitance inside the sensor. An experiment is performed using simulated phantom using sensor having the form of a half-sphere with combined triangular and rectangular shapes. The system is able to measure a capacitance value as low as four femto-Farads with 0.34% margin error.
Keywords :
capacitance measurement; data acquisition; data visualisation; image reconstruction; microcontrollers; tomography; 3D image reconstruction; ECVT; capacitance measurement circuit; data acquisition system; electrical capacitance volume tomography; frequency 2.5 MHz; half-sphere; microcontroller; rectangular shapes; three-dimensional image visualization; triangular shapes; voltage 14.6 V; Capacitance to voltage circuit; Differential circuit; ECVT; Programmable gain amplifier; Standing capacitance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Information Technology and Electrical Engineering (ICITEE), 2013 International Conference on
Conference_Location :
Yogyakarta
Print_ISBN :
978-1-4799-0423-5
Type :
conf
DOI :
10.1109/ICITEED.2013.6676283
Filename :
6676283
Link To Document :
بازگشت