Title :
A novel metric for quantitatively measuring memory effects in OOFDM system
Author :
Muyu Huang ; Jun Li ; Hao He ; Meihua Bi ; Shilin Xiao ; Weisheng Hu
Author_Institution :
Dept. of Electron. Eng., Shanghai Jiao Tong Univ., Shanghai, China
Abstract :
We propose a novel metric to measure memory effects in optical orthogonal frequency-division multiplexing (OOFDM) system. Experiment results indicate the effectiveness of this method by comparing number of error bits at each subcarriers in different memory-depth predistorted scheme.
Keywords :
OFDM modulation; subcarrier multiplexing; OOFDM system; memory-depth predistorted scheme; optical orthogonal frequency-division multiplexing system; quantitatively measuring memory effect; OOFDM; memory effects;
Conference_Titel :
Wireless and Optical Communication Conference (WOCC), 2013 22nd
Conference_Location :
Chongqing
Print_ISBN :
978-1-4673-5697-8
DOI :
10.1109/WOCC.2013.6676429
