• DocumentCode
    650731
  • Title

    Can Refactoring Cyclic Dependent Components Reduce Defect-Proneness?

  • Author

    Oyetoyan, Tosin Daniel ; Cruzes, Daniela Soares ; Conradi, Reidar

  • Author_Institution
    Dept. of Comput. & Inf. Sci., Norwegian Univ. of Sci. & Technol., Trondheim, Norway
  • fYear
    2013
  • fDate
    22-28 Sept. 2013
  • Firstpage
    420
  • Lastpage
    423
  • Abstract
    Previous studies have shown that dependency cycles contain significant number of defects, defect-prone components and account for the most critical defects. Thereby, demonstrating the impacts of cycles on software reliability. This preliminary study investigates the variables in a cyclic dependency graph that relate most with the number of defect-prone components in such graphs so as to motivate and guide decisions for possible system refactoring. By using network analysis and statistical methods on cyclic graphs of Eclipse and Apache-Active MQ, we have examined the relationships between the size and distance measures of cyclic dependency graphs. The size of the cyclic graphs consistently correlates more with the defect-proneness of components in these systems than other measures. Showing that adding new components to and/or creating new dependencies within an existing cyclic dependency structures are stronger in increasing the likelihood of defect-proneness. Our next study will investigate whether there is a cause and effect between refactoring (breaking) cyclic dependencies and defect-proneness of affected components.
  • Keywords
    graph theory; software maintenance; software reliability; Apache-Active MQ; Eclipse; critical defects; cyclic dependency graph; cyclic dependent components refactoring; defect proneness; software reliability; Complexity theory; Conferences; Correlation; Size measurement; Software systems; cyclic dependency graphs; defect-proneness; graph complexities; refactoring;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Software Maintenance (ICSM), 2013 29th IEEE International Conference on
  • Conference_Location
    Eindhoven
  • ISSN
    1063-6773
  • Type

    conf

  • DOI
    10.1109/ICSM.2013.62
  • Filename
    6676922