• DocumentCode
    65077
  • Title

    Improved Hole Transport by {\\rm p}\\hbox {-}{\\rm In}_{x}{\\rm Ga}_{1-x}{\\rm N} Layer in Multiple Quantum Wells of Visible LEDs

  • Author

    Jeomoh Kim ; Mi-Hee Ji ; Lochner, Zachary ; Suk Choi ; Sebkhi, Nordine ; Jianping Liu ; Satter, Md.M. ; Jin Soo Kim ; Yoder, P.D. ; Dupuis, Russell ; Juday, Reid ; Fischer, A.M. ; Ponce, F.A. ; Jae-Hyun Ryou

  • Author_Institution
    Center for Compound Semicond. & Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
  • Volume
    25
  • Issue
    18
  • fYear
    2013
  • fDate
    Sept.15, 2013
  • Firstpage
    1789
  • Lastpage
    1792
  • Abstract
    Studied is the effect of indium (In) mole fraction in p-InxGa1-xN:Mg layers with 0 ≤ xIn ≤ 0.035 on hole injection and transport behaviors in InGaN/GaN multiple quantum wells (MQWs) using dual-wavelength and triple-wavelength active regions. Electro-optical characteristics of light-emitting diodes containing p-layers with different In content and with silicon doping in selected QW barriers (QWBs) are compared to evaluate hole transport in the active region. The results show that enhanced hole transport and corresponding more uniform distribution of holes across the MQW region are achieved by increasing xIn in the p-InxGa1-xN:Mg layer, possibly due to modification in energy of holes by a potential barrier between the p-InGaN and GaN QWB.
  • Keywords
    III-V semiconductors; doping; gallium compounds; indium compounds; light emitting diodes; magnesium; semiconductor quantum wells; silicon; InGaN-GaN; InGaN:Mg; active regions; electro-optical characteristics; hole injection; hole transport; light emitting diodes; mole fraction; multiple quantum wells; quantum well barriers; silicon doping; visible LED; Doping; Gallium nitride; Light emitting diodes; Quantum well devices; Radiative recombination; Silicon; Strain; Epitaxial growth; light emitting diodes; luminescence;
  • fLanguage
    English
  • Journal_Title
    Photonics Technology Letters, IEEE
  • Publisher
    ieee
  • ISSN
    1041-1135
  • Type

    jour

  • DOI
    10.1109/LPT.2013.2275791
  • Filename
    6572864