DocumentCode :
6510
Title :
The Reliability of Subgraphs in the Arrangement Graph
Author :
Limei Lin ; Li Xu ; Shuming Zhou ; Dajin Wang
Author_Institution :
Sch. of Math. & Comput. Sci., Fujian Normal Univ., Fuzhou, China
Volume :
64
Issue :
2
fYear :
2015
fDate :
Jun-15
Firstpage :
807
Lastpage :
818
Abstract :
As the size of a multiprocessor computer system grows, the probability of having faulty (i.e., malfunctioning or failing) processors in the system increases. It is then important to quantify how the faults collectively affect the entire system. The reliability of subsystems in a system, defined as the probability that a fault-free subsystem of a certain size still exists when the system has faults, is a measure for the faults´ effect on the whole system. It can be used as an indicator of system health. In this paper, we will present two schemes to calculate the reliability of an (n-1,k-1)-subgraph in the (n,k)-Arrangement Graph An,k, an extensively studied interconnection network proposed for multiprocessor computers. The first scheme will use a probability fault model and the Principle of Inclusion-Exclusion to establish an upper-bound of the reliability, by taking into account the intersection of not more than three subgraphs. The second scheme uses basically the same idea, but completely neglects the intersection among subgraphs to calculate an approximate reliability. The results of the two schemes are compared, and are shown to be in good agreement, especially as the single-node reliability p goes low.
Keywords :
consecutive system reliability; fault tolerance; graph theory; hypercube networks; multiprocessing systems; probability; (n,k)-arrangement graph; (n-1,k-1)-subgraph reliability calculation; fault-free subsystem; faulty processor probability; inclusion-exclusion principle; interconnection network; multiprocessor computer system; probability fault model; subsystem reliability; system health indicator; Approximation methods; Computational modeling; Computer network reliability; Hypercubes; Probabilistic logic; Reliability; Upper bound; Arrangement graph; inclusion-exclusion principle; probabilistic fault model; subgraph reliability;
fLanguage :
English
Journal_Title :
Reliability, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9529
Type :
jour
DOI :
10.1109/TR.2015.2413372
Filename :
7072564
Link To Document :
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