DocumentCode
652637
Title
How Significant is the Effect of Fault Interactions on Coverage-Based Fault Localizations?
Author
Xiaozhen Xue ; Namin, Akbar Siami
Author_Institution
Dept. of Comput. Sci., Texas Tech Univ., Lubbock, TX, USA
fYear
2013
fDate
10-11 Oct. 2013
Firstpage
113
Lastpage
122
Abstract
The effectiveness of coverage-based fault localizations in the presence of multiple faults has been a major concern for the software testing research community. A commonly held belief is that the fault localization techniques based on coverage statistics are less effective in the presence of multiple faults and their performance deteriorates. The fault interference phenomenon refers to cases where the software under test contains multiple faults whose interactions hinder effective debugging. The immediate research question that arises is to what extent fault interactions are influential. This paper focuses on verifying the existence of fault interference phenomenon in programs developed in programming languages with object-oriented features. The paper then statistically measures the influence and significance of fault interactions on the performance of debugging based on coverage-based fault localizations. The result verifies that the fault interleaving phenomenon occurs. However, its impact on the performance of fault localizations is negligible.
Keywords
object-oriented languages; object-oriented programming; program debugging; program testing; software performance evaluation; software reliability; coverage statistics; coverage-based fault localization; coverage-based fault localization effectiveness; debugging performance; fault interactions; fault interference phenomenon; fault interleaving phenomenon; fault localization techniques; object-oriented features; programming languages; software testing research community; Debugging; Instruments; Interference; Java; Measurement; Software; Debugging; Empirical Studies; Fault Localizations;
fLanguage
English
Publisher
ieee
Conference_Titel
Empirical Software Engineering and Measurement, 2013 ACM / IEEE International Symposium on
Conference_Location
Baltimore, MD
ISSN
1938-6451
Print_ISBN
978-0-7695-5056-5
Type
conf
DOI
10.1109/ESEM.2013.22
Filename
6681344
Link To Document