DocumentCode :
652667
Title :
Application of Statistical Process Control to Software Defect Metrics: An Industry Experience Report
Author :
Fernandez-Corrales, Carla ; Jenkins, Michael ; Villegas, Julian
Author_Institution :
Univ. of Illinois at Urbana-Champaign, Urbana, IL, USA
fYear :
2013
fDate :
10-11 Oct. 2013
Firstpage :
323
Lastpage :
331
Abstract :
Statistical Process Control (SPC) has become of great significance for software engineering organizations as more of them decide to implement quality improvement initiatives. The Capability Maturity Model Integration (CMMI-DEV 1.3) for example, proposes the use of statistical techniques at maturity level 4 to ensure some degree of process predictability. However, the nature of software products and processes poses many challenges to the application of SPC, mainly regarding the design of control charts, a key tool. These challenges have led to opposing views on the applicability of SPC to software processes. This article presents an industry experience report on the application of SPC in a Software Verification and Validation Unit at an Information Technology Division from a financial institution. We present the steps followed to implement SPC in this organization, describe the theoretical assumptions involved in selecting the appropriate control charts, and show a process improvement analysis of using SPC in the organization.
Keywords :
program verification; software metrics; statistical process control; SPC; financial institution; information technology division; software defect metrics; software validation; software verification; statistical process control; Control charts; Measurement; Organizations; Process control; Software; Standards organizations; Statistical Process Control; quantitative management; software metrics; software process improvement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Empirical Software Engineering and Measurement, 2013 ACM / IEEE International Symposium on
Conference_Location :
Baltimore, MD
ISSN :
1938-6451
Print_ISBN :
978-0-7695-5056-5
Type :
conf
DOI :
10.1109/ESEM.2013.51
Filename :
6681375
Link To Document :
بازگشت