• DocumentCode
    653550
  • Title

    Experimental and simulation investigations of DBD plasma reactor at normal environmental conditions

  • Author

    Eid, Ahmad ; Takashima, Katsuyuki ; Mizuno, Akira

  • Author_Institution
    Fac. of Eng., Aswan Univ., Aswan, Egypt
  • fYear
    2013
  • fDate
    6-11 Oct. 2013
  • Firstpage
    1
  • Lastpage
    8
  • Abstract
    In this paper a cylindrical Dielectric Barrier Discharge (DBD) plasma reactor is analyzed and investigated at normal environmental conditions. The stressed voltage is varied up to 40 kV peak to peak with variable frequency up to 4 kHz. In order to compare the experimental findings with the simulation results, an equivalent electrical circuit model is used. To simulate the dynamic micro-discharge inside the plasma reactor, a voltage-controlled current-source is implemented. The reactor is filled with Aluminum Oxide to enhance its operation. An equivalent configuration is proposed to model the region of alumina pellets inside the reactor and to calculate the corresponding equivalent capacitance. It is found that the measured voltage, discharge current and voltage-charge waveforms are consistent with the simulated results. The quantitative comparison of the experimental and simulated data confirms the validity of the developed electrical circuit model of the plasma reactor.
  • Keywords
    alumina; capacitance; discharges (electric); plasma confinement; plasma simulation; Al2O3; alumina pellets; aluminum oxide; cylindrical DBD plasma reactor simulation; dielectric barrier discharge; discharge current; dynamic microdischarge; equivalent capacitance; equivalent electrical circuit model; frequency 4 kHz; voltage 40 kV; voltage-charge waveforms; voltage-controlled current-source; Atmospheric modeling; Current measurement; Inductors; Mathematical model; Plasma measurements; Voltage measurement; Capacitance; Dielectric-barrier discharge reactor; Discharge power; Micro-discharge; Plasma; Simulation model;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industry Applications Society Annual Meeting, 2013 IEEE
  • Conference_Location
    Lake Buena Vista, FL
  • ISSN
    0197-2618
  • Type

    conf

  • DOI
    10.1109/IAS.2013.6682459
  • Filename
    6682459