DocumentCode :
653605
Title :
Recognition of Power Quality events using S-transform based ANN classifier and rule based decision tree
Author :
Kumar, Ravindra ; Singh, Bawa ; Shahani, D.T. ; Chandra, Aniruddha ; Al-Haddad, Kamal
fYear :
2013
fDate :
6-11 Oct. 2013
Firstpage :
1
Lastpage :
8
Abstract :
This paper presents a technique for recognizing the single stage and multiple PQ (Power Quality) events using an algorithm based on ST (Stockwell´s-Transform) and ANN (Artificial Neural Network) based classifier and a rule based decision tree. The ST which combines elements of WT (Wavelet Transform) and STFT (Short-Time Fourier Transform) is used for the analysis of various single stage and multiple power quality events. Single stage PQ events such as sag, swell, interruption, harmonics, transients, notch, spike, flicker and multiple power quality events which include the harmonic disturbances with sag, swell, flicker and interruption are analyzed using the proposed algorithm. A data base of these events is generated in MATLAB as per IEEE-1159 standard. Significant features of various PQ events are extracted using the S-transform and are used as an input to this hybrid classifier. The results are presented for the effective recognition of the PQ events with the proposed algorithm.
Keywords :
Fourier transforms; IEEE standards; decision trees; neural nets; power engineering computing; power supply quality; power system harmonics; wavelet transforms; ANN classifier; IEEE-1159 standard; MATLAB; S-transform algorithm; STFT; Stockwell transform algorithm; WT; artificial neural network classifier; harmonic disturbance; multiple power quality event; power quality event recognition; rule based decision tree; short-time Fourier transform; single stage PQ event; wavelet transform; Harmonic analysis; Instruments; MATLAB; Numerical models; Standards; Time-frequency analysis; Event; Multi-resolution analysis; Power Quality; S-Transform; Wavelet;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industry Applications Society Annual Meeting, 2013 IEEE
Conference_Location :
Lake Buena Vista, FL
ISSN :
0197-2618
Type :
conf
DOI :
10.1109/IAS.2013.6682514
Filename :
6682514
Link To Document :
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