• DocumentCode
    653656
  • Title

    An electrical mine monitoring system utilizing the IEC 61850 standard

  • Author

    Mazur, David C. ; Sottile, Joseph ; Novak, Thomas

  • Author_Institution
    Dev. Eng., Rockwell Autom., Inc., Milwaukee, WI, USA
  • fYear
    2013
  • fDate
    6-11 Oct. 2013
  • Firstpage
    1
  • Lastpage
    10
  • Abstract
    Motor control assets are foundational elements in many industrial operations. In the mining industry, these assets primarily consist of motor control centers and drives, which are available with a comprehensive assortment of control and monitoring devices. Various intelligent electronic devices (IEDs) are now used to prevent machine damage and downtime. As motor control devices have advanced in technology, so too have the IEDs that protect them. These advances have resulted in new standards, such as IEC 61850, that have embedded intelligence and a standard set of communication schemes by which IEDs can share information in a peer-to-peer or one-to-many fashion. This paper discusses the merits and steps involved with interfacing IEDs to a mining process control network via the use of the IEC 61850 standard.
  • Keywords
    IEC standards; SCADA systems; computerised monitoring; local area networks; mining industry; motor drives; process control; Ethernet; IED; SCADA systems; communication schemes; electrical mine monitoring system; embedded intelligence; intelligent electronic devices; lEC 61850 standard; machine damage prevention; machine downtime prevention; mining industry; monitoring devices; motor control assets; motor control centers; motor control devices; motor drives; one-to-many information sharing; peer-to-peer information sharing; Forestry; IEC standards; Load management; Logic gates; Mining industry; Pumps; International Electrotechnical Commission (IEC) 61850; intelligent electronic device; load shedding; load side management; taconite mining;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industry Applications Society Annual Meeting, 2013 IEEE
  • Conference_Location
    Lake Buena Vista, FL
  • ISSN
    0197-2618
  • Type

    conf

  • DOI
    10.1109/IAS.2013.6682565
  • Filename
    6682565