DocumentCode :
653678
Title :
High-Resistance Grounded power system equivalent circuit damage at the line-ground fault location (Part 2)
Author :
Paul, Deleglise ; Sutherland, Peter
Author_Institution :
AECOM, Oakland, CA, USA
fYear :
2013
fDate :
6-11 Oct. 2013
Firstpage :
1
Lastpage :
9
Abstract :
This paper provides electrical equivalent circuits of High-Resistance Grounded (HRG) power systems other than a delta-wye connected utility power supply transformer included in Part 1 of this paper. This paper provides HRG grounding of a medium voltage (MV) generator for connection to an industrial power system and to a utility power system, and discusses line-ground fault with fault resistance. Three-line diagrams of ungrounded power systems to illustrate the HRG grounding application and its effect on ground fault current during line-ground fault are also included. The damage at the fault location is based upon the assumption that the fault remains a line-ground fault until it is cleared by appropriate ground fault protection relays. Fault resistance and fault current that has an effect on damage at the fault location is included. This paper provides guidance to update the current edition of IEEE STD. 142 with respect to HRG systems.
Keywords :
IEEE standards; earthing; equivalent circuits; fault location; industrial power systems; power generation faults; power generation protection; power system reliability; power utilisation; relay protection; HRG system; IEEE STD. 142; MV generator; delta-wye connected utility power supply transformer; ground fault current; ground fault protection relay; high-resistance grounded power system electrical equivalent circuit; industrial power system; line-ground fault location resistance; medium voltage generator; ungrounded power system; Circuit faults; Generators; Grounding; Resistance; Arcing fault; fault resistance; ground fault protection relay; high resistance grounded system; system charging current;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industry Applications Society Annual Meeting, 2013 IEEE
Conference_Location :
Lake Buena Vista, FL
ISSN :
0197-2618
Type :
conf
DOI :
10.1109/IAS.2013.6682587
Filename :
6682587
Link To Document :
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