• DocumentCode
    653697
  • Title

    Study of common-mode voltage measurements for IEC62684

  • Author

    Ray-Lee Lin ; Jhen-Yuan Guo ; Chih-Ming Chang

  • Author_Institution
    Nat. Cheng Kung Univ., Tainan, Taiwan
  • fYear
    2013
  • fDate
    6-11 Oct. 2013
  • Firstpage
    1
  • Lastpage
    8
  • Abstract
    This paper presents the study of common-mode (CM) voltage measurements for IEC62684 regulatory. Due to the digitization error caused by the limited vertical bit number of the analog-to-digital converter (ADC) in oscilloscopes, the CM voltage spectrum measurement of the flyback converter with AC source occurs significant inaccuracy. In order to avoid the digitization error, the CM voltage measurement of the flyback converter with DC source is proposed in this paper. The simplified equivalent circuits of the flyback converter with AC and DC input sources are derived to calculate the ratio of their CM voltages. With 64-bit circuit simulation software SIMPLIS®, the digitization error can be significantly reduced to have high-resolution measurements for the verification of the calculated CM voltage ratio. The ratio of the calculated CM voltages can be used to modify the measurement result with DC source to obtain the equivalent result with AC source.
  • Keywords
    analogue-digital conversion; equivalent circuits; oscilloscopes; voltage measurement; 64-bit circuit simulation software; AC source; CM voltage spectrum measurement; IEC62684 regulatory; SIMPLIS®; analog-to-digital converter; common-mode voltage measurements; digitization error; equivalent circuits; flyback converter; high-resolution measurements; oscilloscopes; vertical bit number; Analog-digital conversion; Gain measurement; Measurement uncertainty; Oscilloscopes; Voltage measurement; Common-mode (CM) voltage; Digitization error; Equivalent circuits; Flyback converter; Full-scale; IEC62684; Measurement; Oscilloscope; Ratio; Vertical bit number;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industry Applications Society Annual Meeting, 2013 IEEE
  • Conference_Location
    Lake Buena Vista, FL
  • ISSN
    0197-2618
  • Type

    conf

  • DOI
    10.1109/IAS.2013.6682606
  • Filename
    6682606