Title :
Characteristics, selection guidelines and performance of circuit protection devices for ASDs
Author :
Neeser, Daniel R. ; Schlegel, David W. ; Verstegen, Louis ; Lemberg, Nicholas
Author_Institution :
Eaton´s Bussmann Bus., Ellisville, MO, USA
Abstract :
The goal of all circuit protection devices is to mitigate and minimize collateral damage when a failure occurs to either the source (ac line) or the equipment. The circuit protection device is often given little attention, that is until erroneous trips hamper performance or unexpectant damage occurs within the equipment. Then the devices are often reviewed for performance characteristics and operating conditions. To meet this need various devices have been designed for this purpose and various standards have been written to provide guidance for the usage of those devices. The focus of this paper will be on the interplay between drive short-circuit current rating (SCCR) and protective device sizing as well as the scaling of such systems, ie should a fuse sized for a 10A circuit have the same guidelines as one used for 1000A. This paper will review how UL 508A, 508C, and the National Electric Code impacts Adjustable Speed Drive (ASD) protection requirements. This paper evaluates a test setup scheme to measure fuse performance. The peak current and I2t test results with both test schemes from three protection devices, a Time Delay (TD) Class J fuse along with two Non Time Delay (NTD) Class J and T fuses, are presented and explained. A novel method of comparing the results is offered by viewing the collateral damage associated with a failure. This methodology has minor impact at low power ratings, but major implications with high power ratings, where equipment is often field repairable.
Keywords :
variable speed drives; ASD protection requirement; National Electric Code; SCCR; UL 508A; UL 508C; ac line; adjustable speed drive protection requirement; circuit protection devices; collateral damage; collateral damage minimization; collateral damage mitigation; current 10 A; current 1000 A; drive short-circuit current rating; nontime delay class J fuse; nontime delay class T fuse; peak current; protective device sizing; selection guidelines; test setup scheme; time delay class J fuse; Circuit faults; Fixtures; Fuses; Market research; Performance evaluation; Variable speed drives; Adjustable Speed Drives; I2t; current-limiting; fuse; short-circuit current rating;
Conference_Titel :
Industry Applications Society Annual Meeting, 2013 IEEE
Conference_Location :
Lake Buena Vista, FL
DOI :
10.1109/IAS.2013.6682613