Title :
Temperature, back gate and polarization studies in nanotransistor based THz plasma detectors
Author :
Knap, Wojciech ; But, D. ; Bawedin, M. ; Chang, Silvia ; Klimenko, O. ; Dyakonova, N. ; Coquillat, Dominique ; El Fatimy, A. ; Teppe, F. ; Gutin, A. ; Nagatsuma, Tadao ; Cristoloveanu, S.
Author_Institution :
LCC, Univ. Montpellier 2, Montpellier, France
Abstract :
Nanometer size field effect transistors can operate as efficient resonant or broadband terahertz detectors, mixers, phase shifters and frequency multipliers at frequencies far beyond their fundamental cut-of frequency. This work is an overview of some recent results concerning the THz detection by Si MOS transistors with back-gate, low temperatures operation, and circular polarization studies of nanometer scale field effect transistors for the detection of terahertz radiation. Also first results on graphene transistors are discussed.
Keywords :
MOSFET; electromagnetic wave polarisation; elemental semiconductors; graphene; nanosensors; plasma devices; radiation detection; silicon; silicon radiation detectors; terahertz wave detectors; C; Si; THz MOS transistor; back gate study; broadband terahertz radiation detector; circular polarization study; frequency multiplier; graphene transistor; low temperature operation study; mixer; nanometer scale size field effect transistor; nanotransistor based THz plasma detector; phase shifter; resonant terahertz radiation detector; Detectors; Logic gates; MOSFET; Mixers; Resonant frequency; Temperature dependence;
Conference_Titel :
Applied Electromagnetics and Communications (ICECom), 2013 21st International Conference on
Conference_Location :
Dubrovnik
Print_ISBN :
978-953-6037-65-0
DOI :
10.1109/ICECom.2013.6684747