Title :
Lumped element model for arbitrarily shaped integrated inductors — A statistical analysis
Author :
Passos, Fabio ; Fino, Maria Helena ; Roca, E. ; Gonzalez-Echevarria, Reinier ; Fernandez, F.V.
Author_Institution :
Fac. of Sci. & Technol., New Univ. of Lisbon, Caparica, Portugal
Abstract :
In this paper a model based in lumped elements is presented for the characterization of integrated inductors. The model allows the modelling of integrated inductors for a wide range of frequencies and different inductor topologies, thus granting the evaluation of important design parameters such as inductance, quality factor and self-resonance frequency. The model will be explained in detail and compared against electromagnetic simulations for a 0.35-μm and 0.13-μm CMOS technologies. Results for square and octagonal geometries are presented. A statistic analysis is also presented for the octagonal topology in order to validate the model over a wide range of geometric variables in 0.35-μm CMOS technology.
Keywords :
CMOS analogue integrated circuits; inductors; integrated circuit design; lumped parameter networks; statistical analysis; electromagnetic simulations; inductance; inductor topologies; integrated inductors; lumped elements; octagonal geometries; quality factor; self-resonance frequency; size 0.13 mum; size 0.35 mum; square geometries; statistic analysis; Capacitance; Inductance; Inductors; Integrated circuit modeling; Mathematical model; Semiconductor device modeling; Spirals; CMOS Analog integrated circuits; EM simulations; Integrated inductor modelling; RF IC Design; statistical study;
Conference_Titel :
Microwaves, Communications, Antennas and Electronics Systems (COMCAS), 2013 IEEE International Conference on
Conference_Location :
Tel Aviv
DOI :
10.1109/COMCAS.2013.6685307
