Title :
Investigation of Scattered H-Wave Based on DRTM
Author :
Takematsu, Masafumi ; Uchida, Kazunori ; Honda, Junichi
Author_Institution :
Fukuoka Inst. of Technol., Fukuoka, Japan
Abstract :
This paper is concerned with a numerical investigation of magnetic wave, scattered by a conducting cylinder to check the accuracy of numerical results based on the discrete ray tracing method (DRTM). First, the boundary profile of the cylinder is approximated in terms of piecewise-linear plates. Source and image rays are searched for the approximated boundary composed of finite number of plates. Second, numerical computations are carried out for total fields, superposing the scattered fields from each conducting plate, using source and image diffraction coefficients with the Fresnel function. Numerical results of H-wave based on DRTM are compared with rigorous solutions given by use of the Bessel and Hankel functions. Finally, it is demonstrated that the DRTM results of H-wave, are in good agreement with those results obtained by the rigorous solutions and we show an appropriate guideline to discretize the boundary to achieve as small errors as possible.
Keywords :
Bessel functions; conductors (electric); electromagnetic wave scattering; numerical analysis; piecewise linear techniques; ray tracing; shapes (structures); Bessel functions; DRTM; Fresnel function; Hankel functions; approximated boundary; boundary profile; conducting cylinder; conducting plate; discrete ray tracing method; image diffraction coefficients; image rays; magnetic wave; numerical investigation; piecewise-linear plates; scattered H-wave; source diffraction coefficients; source rays; Accuracy; Electromagnetic scattering; Image edge detection; Magnetic resonance imaging; Rough surfaces; Surface roughness; DRTM; H-wave; cylindrical conductor; image diffraction; numerical accuracy; scattering; source diffraction;
Conference_Titel :
Network-Based Information Systems (NBiS), 2013 16th International Conference on
Conference_Location :
Gwangju
Print_ISBN :
978-1-4799-2509-4
DOI :
10.1109/NBiS.2013.85