Title :
Nanostructured RFID technology: Attack-response and temperature-robustness investigations
Author :
Kheir, Mohamed S. ; Kreft, Heinz ; Knochel, Reinhard
Author_Institution :
Inst. of Electr. & Inf. Eng., Christian-Albrechts-Univ. of Kiel, Kiel, Germany
Abstract :
Intensive experimental investigations on a newly-proposed Radio Frequency Identification (RFID) technology are presented. This RFID technology is based on physical one-way functions or so-called Physical Unclonable Functions (PUFs). It is mainly intended to provide some means for securing electronic chips using a simple method carried out during chip fabrication process. An RF passive device is utilized to generate such PUFs (or fingerprints) using near-field scattering information. Such device is meant to be an experimental prototype for verifying the functionality of the concept preceding the on-chip implementation stage. Temperature measurements are performed from -20°C up to 70°C in order to check system reliability under diverse environmental conditions. Attack-response is also investigated to check its capability of resisting physical tampering. Promising results are obtained in the frequency range of 10 MHz up to 15 GHz which verifies the reliability of the proposed technique.
Keywords :
nanoelectronics; radiofrequency identification; temperature measurement; RF passive device; attack response investigation; chip fabrication process; electronic chips; frequency 10 MHz to 15 GHz; nanostructured RFID technology; near field scattering information; physical unclonable function; radio frequency identification technology; temperature -20 C to 70 C; temperature measurement; temperature robustness investigation; Cavity resonators; Frequency measurement; Radiofrequency identification; Scattering parameters; Security; Temperature measurement; Near-field; RF certificate of authenticity (RF-CoA); RF fingerprint; RFID; physical unclonable function (PUF);
Conference_Titel :
Microwave Conference (EuMC), 2013 European
Conference_Location :
Nuremberg