Calibration method for near-field measurement used in reflectarray characterization

In this paper, a calibration method of a near-field measurement for reflectarray characterization is presented. First, a waveguide calibration is performed to eliminate the influence of the directional coupler used in the measurement scheme. Second, the reflection measurement is modelled with a metal plate drawn away from the probe aperture. With this model, the variation of the measurement distance due to alignment errors can be taken into account in the reflectarray element characterization. A staircase-shaped test target has been manufactured and measured for validating the functionality of the model.