Title :
Device characterization for LTE applications with wideband baseband, fundamental and harmonic impedance control
Author :
Manjanna, A. Kumar ; Marchetti, Mirco ; Buisman, Koen ; Spirito, M. ; Pelk, M.J. ; de Vreede, Leo C. N.
Author_Institution :
Anteverta-mw B.V., Delft, Netherlands
Abstract :
With this work we address the linearity characterization of active devices within an active load pull characterization setup. Realistic real-life circuit scenarios can be mimicked and adjusted without compromise or tradeoffs in favor of improved EVM and ACPR for communication standard compliant test signals like LTE advanced.
Keywords :
Long Term Evolution; harmonics suppression; ACPR; EVM; LTE advanced; Long Term Evolution; active load pull characterization setup; harmonic impedance control; wideband baseband impedance terminations; Baseband; Harmonic analysis; Impedance; Impedance measurement; Linearity; Wideband;
Conference_Titel :
Microwave Conference (EuMC), 2013 European
Conference_Location :
Nuremberg
