Title :
Microwave characterization of low volume materials in the ISM band
Author :
Jamal, Rammal ; Olivier, Tantot ; Nicolas, Delhote ; Serge, Verdeyme ; Michel, A.
Author_Institution :
XLIM, Univ. of Limoges, Limoges, France
Abstract :
We describe a near field microwave microscopy method for characterization and rapid non-destructive imaging of dielectric materials samples at 2.45 GHz. This system is composed of a probe coupled to a dielectric resonator. It is used for two purposes: first to characterize dielectric samples with accuracy and high spatial resolution, knowing that they do not have predetermined forms but a small plane surface; and second, to draw dielectric cartographies for flat samples, with a 100 μm resolution.
Keywords :
dielectric materials; dielectric resonators; microwave imaging; nondestructive testing; ISM band; dielectric material; dielectric resonator; frequency 2.45 GHz; low volume material; microwave characterization; near field microwave microscopy method; rapid nondestructive imaging; Dielectric measurement; Dielectrics; Microwave imaging; Microwave theory and techniques; Permittivity; Probes; Resonant frequency; dielectric constant; dielectric material; dielectric resonator; matrial characterization; near field microscopy;
Conference_Titel :
Microwave Conference (EuMC), 2013 European
Conference_Location :
Nuremberg
