• DocumentCode
    655737
  • Title

    A LSNA configured to perform baseband engineering for device linearity investigations under modulated excitations

  • Author

    Ogboi, F.L. ; Tasker, P.J. ; Akmal, M. ; Lees, J. ; Benedikt, J. ; Bensmida, S. ; Morris, Kirsten ; Beach, M. ; McGeehan, Joe

  • Author_Institution
    Centre for High Freq. Eng., Cardiff Univ., Cardiff, UK
  • fYear
    2013
  • fDate
    6-10 Oct. 2013
  • Firstpage
    684
  • Lastpage
    687
  • Abstract
    A Large Signal Network Analyzer (LSNA) system has been configured to automatically engineer specific baseband voltage waveforms that, when injected into the output of an active device enable novel device linearization investigations. This is achieved using a formulation, generalized in the envelope domain, to describe the required baseband injection voltage. The advantage of this formulation is that it can be used to compute and then engineer the required baseband injection voltage signals, for arbitrary amplitude modulated envelopes, in terms of a limited set of describing coefficients. Using this approach, it is possible to determine the optimum baseband signal coefficients necessary to linearize a 10W Cree GaN HEMT device using baseband injection techniques. The formulation is validated by experimental investigation, using a 3-tone modulated signal, where the optimum output baseband signal for third and fifth order IMD suppression is successfully identified. For the optimum case, the observed level of IM3 and IM5 distortion was reduced to less than -56dBc whilst driving into 1.5 dB of compression.
  • Keywords
    III-V semiconductors; amplitude modulation; gallium compounds; high electron mobility transistors; interference suppression; linearisation techniques; network analysers; nonlinear distortion; wide band gap semiconductors; 3-tone modulated signal; GaN; HEMT device; IM3 distortion; IM5 distortion; LSNA system; arbitrary amplitude modulated envelopes; baseband engineering; baseband injection voltage signals; baseband voltage waveforms; device linearity; device linearization; fifth order IMD suppression; large signal network analyzer; modulated excitations; nonlinear distortion; optimum baseband signal coefficients; optimum output baseband signal; third order IMD suppression; Baseband; Current measurement; Distortion measurement; Microwave amplifiers; Nonlinear distortion; Radio frequency; Voltage measurement; Multi-tone modulation; baseband; linearization; non-linear distortion;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Conference (EuMC), 2013 European
  • Conference_Location
    Nuremberg
  • Type

    conf

  • Filename
    6686748