Title :
Low-jitter electrooptic sampling of active mm-Wave devices up to 300 GHz
Author :
Jamshidifar, M. ; Spickermann, G. ; Eberwein, H. Schafer ; Bolivar, P. Haring
Author_Institution :
Inst. of High Freq. & Quantum Electron., Univ. of Siegen, Siegen, Germany
Abstract :
In this work we present an electrooptic sampling system for on-wafer characterization of ultrafast active electronic devices. The system capabilities are demonstrated on a prototype 65 nm CMOS nonlinear transmission line circuit. Device operation and sampling up to 300 GHz is achieved by diminishing the relative time jitter between source and sampler.
Keywords :
CMOS integrated circuits; electro-optical devices; jitter; millimetre wave devices; transmission lines; CMOS nonlinear transmission line circuit; active mm wave devices; low jitter electrooptic sampling; on wafer characterization; relative time jitter; size 65 nm; ultrafast active electronic devices; Antenna measurements; Bandwidth; Earth Observing System; Electrooptical waveguides; Jitter; Measurement by laser beam; Transmission line measurements; Electrooptic sampling; Nonlinear transmission line; THz; mm-wave;
Conference_Titel :
Microwave Conference (EuMC), 2013 European
Conference_Location :
Nuremberg
