Near field characterisation of electromagnetic interference from multilayered printed circuit boards

This paper presents a method using equivalent dipole sources for characterising the electromagnetic interference from multilayered printed circuit boards. The method greatly reduces the computational complexity of characterizing the near fields form complex circuit boards. For multilayered boards, however, full three dimensional scans have to be performed and consideration has to be made for the diffraction around the finite ground plane. The required scanning resolution and dipole equivalent dipole resolution needed for accurate characterization over a large frequency range is discussed and the possible extension to time domain modeling is described.