Title :
An efficient closed-form expression of spatial Green´s function for finite dielectric substrate using characteristic Green´s function-perfectly matched layer method
Author :
Torabi, Abdorreza ; Shishegar, Amir Ahmad
Author_Institution :
Dept. of Electr. Eng., Sharif Univ. of Technol., Tehran, Iran
Abstract :
An efficient closed-form spatial Green´s function solution is derived for open finite dielectric substrate. By placing perfectly matched layer (PML) that is backed by perfect electric conductor (PEC) in semi-infinite layer at the top and/or bottom and by using characteristic Green´s function (CGF) technique, a closed-form series representation of spatial Green´s function is obtained. Utilizing the eigenmodes of the closed structure by PML called the Berenger and quasi-leaky wave poles, continuous spectrum contribution of the original structure is simply evaluated. Derived Green´s function is exact for separable structure while it is approximate for nonseparable one. By importing Generalized scattering matrix (GSM) in CGF formulation, more exact results for nonseparable structures are obtained. Analytic knowledge of the source and observation points dependence allows very efficient computation and storage of the Green´s function. Excellent agreements with the rigorous method of moments (MOM) are demonstrated.
Keywords :
Green´s function methods; S-matrix theory; dielectric materials; method of moments; substrates; Berenger wave pole; CGF formulation; CGF technique; GSM; MOM; PEC; PML; characteristic Green function-perfectly matched layer method; closed-form expression; closed-form series representation; continuous spectrum contribution; derived Green function; eigenmodes; generalized scattering matrix; method-of-moments; open finite dielectric substrate; perfect electric conductor; quasileaky wave pole; semiinfinite layer; spatial Green function; Dielectric substrates; GSM; Green´s function methods; Method of moments; Substrates; Surface waves;
Conference_Titel :
Microwave Conference (EuMC), 2013 European
Conference_Location :
Nuremberg