Title :
Low-loss 3-bit tunable SIW filter with PIN diodes and integrated bias network
Author :
Sirci, Stefano ; Martinez, Jorge D. ; Boria, Vicente E.
Author_Institution :
iTEAM, Univ. Politec. de Valencia, Valencia, Spain
Abstract :
A 3-bit digitally tunable band-pass filter with up to 8 nearly equi-spaced frequency responses between 4-4.4 GHz has been designed and simulated in a low-cost single-layer Substrate Integrated Waveguide (SIW) technology. The structure is based on coupled coaxial SIW resonators embedded into the dielectric. The proposed filter achieves discrete frequency tuning by using PIN diodes as tuning elements of a switchable loading capacitance. Thus, a 2-pole filter demonstrator has been designed on a 3.175 mm-thick Rogers RT/Duroid 5880 substrate (εr = 2.2, tan δ = 9·10-4). The integration of the bias network onto the SIW metal layers allows a simpler assembly without degrading the filter performance. Insertion loss ranging from 1.45 dB to 2.6 dB have been obtained, with minim return loss better about 10 dB. Additionally, the proposed filter presents a very compact layout due to the combline topology and the integration of the bias circuitry. The device shows promising application for the design of discretely tunable narrow filters with higher Q factor.
Keywords :
Q-factor; band-pass filters; circuit tuning; frequency response; p-i-n diodes; resonators; substrate integrated waveguides; waveguide filters; 2-pole filter demonstrator; PIN diodes; Q factor; Rogers RT-Duroid 5880 substrate; SIW metal layers; assembly; bias circuitry; coupled coaxial SIW resonators; dielectric; digitally-tunable band-pass filter; discretely-tunable narrow filters; equispaced frequency responses; insertion loss; integrated bias network; low-cost single-layer substrate integrated waveguide technology; low-loss tunable SIW filter; switchable loading capacitance; tuning elements; Capacitance; Cavity resonators; Loading; PIN photodiodes; Substrates; Switches; Tuning;
Conference_Titel :
Microwave Conference (EuMC), 2013 European
Conference_Location :
Nuremberg