Title :
A robust Ku-band low noise amplifier using an industrial 0.25-µm AlGaN/GaN on SiC process
Author :
Resca, Davide ; Scappaviva, Francesco ; Florian, Corrado ; Rochette, Stephane ; Muraro, Jean-Luc ; di Giacomo Brunel, Valeria ; Chang, Carole ; Baglieri, Didier
Author_Institution :
Microwave Electron. for Commun., MEC srl, Bologna, Italy
Abstract :
Besides the well known outstanding characteristics in terms of power density and thermal behavior, which are largely exploited for microwave high power applications, AlGaN/GaN HEMT technologies have demonstrated promising results for the design of low noise, high-dynamic-range and highly rugged amplifiers. In this paper we describe the design, implementation and characterization of a Ku-band MMIC Low Noise Amplifier for telecom Space applications, exploiting an industrial AlGaN/GaN 0.25 μm HEMT on SiC process. In the frequency band 12.8-14.8 GHz, the LNA features a linear gain over 20 dB with a Noise Figure below 1.85 dB. Input and output return losses are better than -9 dB in the same band. Power dissipation is 840 mW in linear operation. The LNA delivers about 25 dBm of output power at 1 dB compression point and it has been tested to survive without performance degradation 25 dBm of CW input power.
Keywords :
III-V semiconductors; MMIC amplifiers; aluminium compounds; gallium compounds; high electron mobility transistors; low noise amplifiers; silicon compounds; wide band gap semiconductors; AlGaN-GaN; HEMT technologies; Ku-band MMIC low noise amplifier; SiC; frequency 12.8 GHz to 14.8 GHz; high-dynamic-range amplifier; highly rugged amplifier; power density; size 0.25 mum; telecom space applications; thermal behavior; Gain; Gallium nitride; HEMTs; Logic gates; Noise; Noise measurement; Robustness; AlGaN/GaN HEMT; Low Noise Amplifier; MMIC amplifier; robust amplifier; robustness;
Conference_Titel :
Microwave Conference (EuMC), 2013 European
Conference_Location :
Nuremberg