Title :
Guest Editorial Special Section on the 2012 International Conference on Microelectronic Test Structures
Author :
Weiland, Larg H.
Author_Institution :
PDF Solutions, Inc., San Jose, CA, USA
Abstract :
This special section is comprised of six papers which are based on work that was presented at the 2012 International Conference on Microelectronic Test Structures, held in San Diego, CA, USA, March 19-22.
Keywords :
Meetings; Microelectronics; Special issues and sections; Test equipment; Testing;
Journal_Title :
Semiconductor Manufacturing, IEEE Transactions on
DOI :
10.1109/TSM.2013.2272482
