DocumentCode :
656584
Title :
Analog compensation of AM-AM and AM-PM effects for high-efficiency stacked-FET power amplifiers in 65-nm standard CMOS
Author :
Zohny, Amr ; Leuschner, Stephan ; Rascher, Jochen ; Pinarello, S. ; Ussmueller, T. ; Mueller, J.-E. ; Fischer, Georg ; Weigel, Robert
Author_Institution :
Inst. of Electron. Eng., Friedrich-Alexander Univ. of Erlangen-Nuremberg, Erlangen, Germany
fYear :
2013
fDate :
6-8 Oct. 2013
Firstpage :
165
Lastpage :
168
Abstract :
Simultaneously achieving high linearity and high power-added efficiency (PAE) is essential for power amplifiers (PA) operating with modern communication signals. The challenge is exacerbated by the low breakdown voltages of standard CMOS realizations. This work presents a low-complexity programmable analog scheme to compensate the strong AM-AM and AM-PM nonlinearities of the high-ruggedness stacked-cascode topology while maintaining high PAE. The proposed solution utilizes standard NMOS devices to achieve peak PAE of 60% at the 900 MHz band from a 3V supply. The compensation scheme manages to improve the output 1-dB compression point by up to 2 dB and keep the AM-PM variation within 5 degrees. The proposed method improves the linear output power (@ ACPR= -40 dBc) for a Class-AB power amplifier by up to 1.5 dB without compromising PAE or saturated output power.
Keywords :
CMOS analogue integrated circuits; MOS integrated circuits; MOSFET; electric breakdown; network topology; power amplifiers; AM-AM effects; AM-AM nonlinearities; AM-PM effects; AM-PM nonlinearities; CMOS; PAE; analog compensation; breakdown voltages; class-AB power amplifier; compensation scheme; frequency 900 MHz; high-efficiency stacked-FET power amplifiers; high-ruggedness stacked-cascode topology; linear output power; low-complexity programmable analog scheme; modern communication signals; power-added efficiency; size 65 nm; standard NMOS devices; voltage 3 V; CMOS integrated circuits; Linearity; Multiaccess communication; Power amplifiers; Power generation; Spread spectrum communication; Standards; CMOS; Power amplifier; linearization; ruggedness; stacked FET; stacked cascode;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Integrated Circuits Conference (EuMIC), 2013 European
Conference_Location :
Nuremberg
Type :
conf
Filename :
6687811
Link To Document :
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