Title : 
Next-generation CMOS-on-insulator multi-element network for broadband antenna tuning
         
        
            Author : 
Ranta, Tero ; Whatley, Richard ; Chih-Chieh Cheng ; Facchini, Marc
         
        
            Author_Institution : 
Mobile Wireless Solutions Bus. Unit, Peregrine Semicond. Corp., San Diego, CA, USA
         
        
        
        
        
        
            Abstract : 
Increased spectrum coverage and data rates required by 3G/4G/LTE mobile wireless devices are dictating the need for active antenna systems. Advancements in technology and design techniques have enabled new and innovative solutions for implementing antenna tuning and impedance matching. High Quality (Q) factor Digitally Tunable Capacitors (DTCs), tuning switches and reconfigurable tuners allow for dynamic adjustment of an antenna´s electrical characteristics, and extended low-band coverage through the implementation of aperture tuning and tunable matching networks. This paper discusses the product capabilities and design options that result in improved antenna operating bandwidth.
         
        
            Keywords : 
3G mobile communication; 4G mobile communication; CMOS integrated circuits; Long Term Evolution; Q-factor; broadband antennas; 3G/4G/LTE mobile wireless device; DTC; active antenna system; antenna operating bandwidth; broadband antenna tuning; digitally tunable capacitor; electrical characteristics; impedance matching; matching network; next-generation CMOS-on-insulator multielement network; quality factor; reconfigurable tuner; spectrum coverage; tuning switches; Antennas; Capacitors; Impedance; Insertion loss; Transducers; Tuners; Antennas; Aperture Tuning; CMOS-on-Insulator; CMOS-on-Sapphire; DTC; Digitally Tunable Capacitor; Quality Factor; Reconfigurable RF Front-end; Reconfigurable Tuner; SOI; Silicon-on-Sapphire; Tunable Matching Networks;
         
        
        
        
            Conference_Titel : 
Microwave Integrated Circuits Conference (EuMIC), 2013 European
         
        
            Conference_Location : 
Nuremberg