• DocumentCode
    656840
  • Title

    Wavelet solution of the Schrödinger equation for a triangular potential barrier and applied results on a MOM tunnel junction

  • Author

    Malureanu, Emilia-Simona ; Craciunoiu, F.

  • Author_Institution
    Electr. Mater. Lab., Politeh. Univ. of Bucharest, Bucharest, Romania
  • Volume
    1
  • fYear
    2013
  • fDate
    14-16 Oct. 2013
  • Firstpage
    65
  • Lastpage
    68
  • Abstract
    Quantum tunneling has many important applications in electronics. In thin layers structures, when the tunneling phenomenon occurs at the metal-insulator contact barrier, as for the MIM or MOS structures, we are dealing with the Fowler-Nordheim field emission. In these structures we have to calculate the currents densities that go through. The current density is calculated based on the transmission coefficient through the barrier, which is determined by solving the Schrödinger equation. The calculation methods currently used lead to values that get predictions of emission current density too low. The transmission coefficient is calculated by wavelet approximation and the results are validated experimentally on a lateral MOM tunnel junction.
  • Keywords
    MIM structures; Schrodinger equation; aluminium; current density; field emission; silicon compounds; tunnelling; Al-SiO2-Al; Fowler-Nordheim field emission; MOS structures; Schrodinger equation; emission current density; lateral MOM tunnel junction; metal-insulator contact barrier; quantum tunneling; thin layers structures; transmission coefficient; triangular potential barrier; tunneling phenomenon; wavelet approximation; wavelet solution; Current density; Electric potential; Electrodes; Equations; Mathematical model; Tunneling; MOM junction; Schrödinger equation; dyadic wavelets; potential barriers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Conference (CAS), 2013 International
  • Conference_Location
    Sinaia
  • ISSN
    1545-827X
  • Print_ISBN
    978-1-4673-5670-1
  • Electronic_ISBN
    1545-827X
  • Type

    conf

  • DOI
    10.1109/SMICND.2013.6688091
  • Filename
    6688091