Title : 
Nano-precision force and displacement measurements using MEMS resonant structures
         
        
            Author : 
Mehdizadeh, Emad ; Guo, Xuemei ; Pourkamali, Siavash ; Hajjam, A. ; Rahafrooz, A.
         
        
            Author_Institution : 
Electr. Eng. Dept., Univ. of Texas at Dallas, Richardson, TX, USA
         
        
        
        
        
        
            Abstract : 
This work presents a new approach for measuring sub-nano-Newton forces and sub-picometer displacements using MEMS resonators. Different versions of thermally actuated dual plate micromechanical resonators coupled to electrostatic actuators are utilized as highly sensitive force/displacement sensors. The force generated by the actuator strains the associated resonator changing its resonant frequency. Upon thorough characterization, this approach can be used as a reliable and accurate solution for force and displacement measurements in micro and nano-electromechancial systems. Frequency-force and displacement sensitivities as high as 17Hz/nN and 540 Hz/pm have been measured for the presented structures, respectively, showing the potential of such devices for sub-nanoscale force and displacement measurement resolutions.
         
        
            Keywords : 
displacement measurement; electrostatic actuators; force measurement; force sensors; frequency measurement; microfabrication; micromechanical resonators; microsensors; reliability; MEMS resonant structure; actuator strain generation; displacement measurement; electrostatic actuator coupling; frequency-force measurement; highly sensitive force-displacement sensor; microelectromechancial system; nanoelectromechancial system; nanoprecision force measurement; reliability; subnanoNewton force measurement; subpicometer displacement measurement; thermally actuated dual plate micromechanical resonator; Actuators; Displacement measurement; Force; Frequency measurement; Micromechanical devices; Resonant frequency; Sensors;
         
        
        
        
            Conference_Titel : 
SENSORS, 2013 IEEE
         
        
            Conference_Location : 
Baltimore, MD
         
        
        
        
            DOI : 
10.1109/ICSENS.2013.6688240