• DocumentCode
    657514
  • Title

    International standardization of Open Systems Dependability

  • Author

    Takamura, Hiroki

  • Author_Institution
    Dependable Embedded OS R&D Center, Japan Sci. & Technol. Agency (JST), Tokyo, Japan
  • fYear
    2013
  • fDate
    4-7 Nov. 2013
  • Firstpage
    46
  • Lastpage
    46
  • Abstract
    In this talk, we will explain our current status of international standardization activities in DEOS project.
  • Keywords
    open systems; software reliability; software standards; standardisation; DEOS project; international standardization; open systems dependability; IEC; IEC standards; Open systems; Presses; International Electrotechnical Commission (IEC); Open Systems Dependability; The Open Group (TOG); the DEOS process;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Software Reliability Engineering Workshops (ISSREW), 2013 IEEE International Symposium on
  • Conference_Location
    Pasadena, CA
  • Type

    conf

  • DOI
    10.1109/ISSREW.2013.6688863
  • Filename
    6688863
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=657514