Title :
Smart defect classification for better analysis using tagging mechanisms
Author :
Meena, Sachin ; Balasubramani, Uma M.
Author_Institution :
IBM India Pvt, Ltd., India
Abstract :
Summary form only given. Defect classification plays a major role in categorizing the defects based on components, sub components, different product areas etc. A well defined defects classification mechanism is a base for any type of defect analysis. Defects can be classified based on tags. These tags can be user-defined, shared or personal tags related to any area in a product. Tags can be used for searching the work items and viewing the tagged artifacts. Tags are very easy to create but yet very helpful in categorizing the defects for analysis. Tags are generally used for very specific, detailed defect analysis. During the product implementation, we have used this tagging mechanism extensively which helped us analyzing the defects for better product stability, better performance, focusing on specific areas that needs improvement in the product. We created filter for the tags and saved that view in the project dashboard for quick analysis. We also used the defect view to create a tag cloud which displays the number of work items by tag attribute. In this article, we would show how to use tags effectively and write query with tag attribute for filtering of defects in specific areas in a product. Upon analyzing these tags we found some interesting issues in the product. In this paper, we will show defect categorization using tag cloud in a dynamic way. We will also present how tag cloud provides details of the defect based on importance and number of occurrences. The defect analysis also highlighted some components which needed more attention.
Keywords :
information filtering; information filters; pattern classification; query processing; software reliability; defect analysis; defect categorization; defect filtering; personal tags; product improvement; product stability; project dashboard; query processing; shared tags; smart tagging mechanism defect classification; tag attribute; tag cloud creation; tag filter; tagged artifacts; user-defined tags; work item search; Abstracts; Electronic mail; Filtering; Focusing; Stability analysis; Tag clouds; Defect Analysis; Defect Classification; Defect density; Tag Cloud; Tagging;
Conference_Titel :
Software Reliability Engineering Workshops (ISSREW), 2013 IEEE International Symposium on
Conference_Location :
Pasadena, CA
DOI :
10.1109/ISSREW.2013.6688871