Title :
An empirical study on clustering for isolating bugs in fault localization
Author :
Yanqin Huang ; Junhua Wu ; Yang Feng ; Zhenyu Chen ; Zhihong Zhao
Author_Institution :
State Key Lab. for Novel Software Technol., Nanjing Univ., Nanjing, China
Abstract :
Spectrum-based Fault Localization (SBFL) techniques use risk evaluation formulas to calculate each statement´s likelihood of having a bug based on test results. SBFL can not only be used in statement level, but also can be used with other program entities such as branches, functions and so on. Most previous studies have been conducted under the assumption of a single bug. However, software always contains multi-bugs in practice. A natural idea of debugging is to isolate bugs and then use SBFL techniques to locate one bug for each group. In this paper, we conduct an empirical study on clustering for isolating bugs in fault localization. We analyze the effects of six fault localization techniques and two cluster algorithms. The main observations are: (1) ER5 (Wong1) achieves the best results of fault localization with clustering; (2) K-means outperforms hierarchical clustering for isolating bugs in fault localization.
Keywords :
pattern clustering; program debugging; SBFL techniques; bugs isolation; k-means clustering algorithm; multi bugs; risk evaluation formulas; spectrum-based fault localization techniques; Clustering algorithms; Computer bugs; Educational institutions; Flexible printed circuits; Partitioning algorithms; Sociology; Statistics; Spectrum-Based Fault Localization; cluster algorithms; multi-bugs;
Conference_Titel :
Software Reliability Engineering Workshops (ISSREW), 2013 IEEE International Symposium on
Conference_Location :
Pasadena, CA
DOI :
10.1109/ISSREW.2013.6688893