• DocumentCode
    6583
  • Title

    Kink Effect in {\\rm S}_{22} for GaN and GaAs HEMTs

  • Author

    Crupi, Giovanni ; Raffo, Antonio ; Caddemi, Alina ; Vannini, Giorgio

  • Author_Institution
    DICIEAMA, Univ. of Messina, Messina, Italy
  • Volume
    25
  • Issue
    5
  • fYear
    2015
  • fDate
    May-15
  • Firstpage
    301
  • Lastpage
    303
  • Abstract
    This letter provides a clear understanding of the kink effect in S22 for active solid-state electronic devices. The origin of the kink effect is ascribed to the intrinsic section of the transistor, whereas the extrinsic elements determine its shape at the extrinsic ports. Therefore, to fairly compare the kink effect for GaN and GaAs HEMTs, the present analysis is not only focused on the whole devices but also on their intrinsic sections. The experimental evidence shows that, independently of the specific semiconductor technology, the size and the frequency band of the kink effect are mainly due to the values of the intrinsic transconductance and capacitances, respectively.
  • Keywords
    III-V semiconductors; S-parameters; gallium arsenide; high electron mobility transistors; GaAs; GaAs HEMT; GaN; GaN HEMT; active solid-state electronic devices; capacitances; extrinsic elements; extrinsic ports; intrinsic section; intrinsic transconductance; kink effect; specific semiconductor technology; Gallium arsenide; Gallium nitride; HEMTs; Logic gates; MODFETs; Microwave transistors; Equivalent circuit; GaAs; GaN; HEMT; kink effect; scattering parameter measurements;
  • fLanguage
    English
  • Journal_Title
    Microwave and Wireless Components Letters, IEEE
  • Publisher
    ieee
  • ISSN
    1531-1309
  • Type

    jour

  • DOI
    10.1109/LMWC.2015.2409989
  • Filename
    7072575