• DocumentCode
    658521
  • Title

    Keynote Address

  • Author

    Kwang-Ting Cheng

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of California, Santa Barbara, Santa Barbara, CA, USA
  • fYear
    2013
  • fDate
    18-21 Nov. 2013
  • Abstract
    There exist meaningful patterns in test data. Test data analytics, which explores the hidden patterns and correlations in the test data, has a wide range of applications such as reducing test time, improving test quality, identifying outliers for diagnosis, discovering weak links in the manufacturing process, and improving the robustness of the design. There are clear benefits to formulate test problems as data analysis problems and employ existing mathematical tools, as well as develop additional supporting tools, in predictive analytics, data mining, and statistical modeling for uncovering hidden patterns, unknown correlations and other useful information in the production test data. In the talk, we will describe some promising directions in test data analytics and discuss some of their applications.
  • Keywords
    data analysis; data mining; data analysis problems; data mining; manufacturing process; mathematical tools; predictive analytics; production test data analytics; statistical modeling; test quality;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Symposium (ATS), 2013 22nd Asian
  • Conference_Location
    Jiaosi Township
  • ISSN
    1081-7735
  • Type

    conf

  • DOI
    10.1109/ATS.2013.67
  • Filename
    6690601