DocumentCode
658521
Title
Keynote Address
Author
Kwang-Ting Cheng
Author_Institution
Dept. of Electr. & Comput. Eng., Univ. of California, Santa Barbara, Santa Barbara, CA, USA
fYear
2013
fDate
18-21 Nov. 2013
Abstract
There exist meaningful patterns in test data. Test data analytics, which explores the hidden patterns and correlations in the test data, has a wide range of applications such as reducing test time, improving test quality, identifying outliers for diagnosis, discovering weak links in the manufacturing process, and improving the robustness of the design. There are clear benefits to formulate test problems as data analysis problems and employ existing mathematical tools, as well as develop additional supporting tools, in predictive analytics, data mining, and statistical modeling for uncovering hidden patterns, unknown correlations and other useful information in the production test data. In the talk, we will describe some promising directions in test data analytics and discuss some of their applications.
Keywords
data analysis; data mining; data analysis problems; data mining; manufacturing process; mathematical tools; predictive analytics; production test data analytics; statistical modeling; test quality;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Symposium (ATS), 2013 22nd Asian
Conference_Location
Jiaosi Township
ISSN
1081-7735
Type
conf
DOI
10.1109/ATS.2013.67
Filename
6690601
Link To Document