DocumentCode
658522
Title
Invited talks
Author
Wu-Tung Cheng ; Shen, William Wu
fYear
2013
fDate
18-21 Nov. 2013
Abstract
These invited talk discuss the following: New Approaches to Improving Quality and Accelerating Yield Ramp to Meet Process Technology Disruptions; 3DIC´s System Design Impact and Testing Needs.
Keywords
integrated circuit design; integrated circuit testing; three-dimensional integrated circuits; 3DIC; process technology disruptions; quality improvement; system design impact; testing needs; yield ramp;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Symposium (ATS), 2013 22nd Asian
Conference_Location
Jiaosi Township
ISSN
1081-7735
Type
conf
DOI
10.1109/ATS.2013.68
Filename
6690602
Link To Document