• DocumentCode
    658532
  • Title

    Multicycle-aware At-speed Test Methodology

  • Author

    Kun-Han Tsai ; Xijiang Lin

  • Author_Institution
    Mentor Graphics Corp., Wilsonville, OR, USA
  • fYear
    2013
  • fDate
    18-21 Nov. 2013
  • Firstpage
    49
  • Lastpage
    49
  • Abstract
    Multicycle paths are commonly seen in today´s high performance designs with multi-frequency clock domains. Previous methods either treat the multicycle paths as false paths and masking the transition on the paths, or slow down the clocks in order to test the multicycle paths. Both approaches would compromise the at-speed test quality. In this paper, we present an at-speed test methodology to target the faults on the multicycle paths using the same clock scheme as regular faults at the single cycle paths. The methodology takes SDC files which defines all timing exceptions and the clock frequency information and create at-speed pattern set that detects faults on both single and multicycle paths. The approach also handles all of the timing exceptions and constraints defined in SDC to prevent simulation mismatches. The experiment results on couple industrial designs demonstrate the effectiveness and efficiency of the proposed methodology to handle complex designs with large timing exception paths.
  • Keywords
    automatic test pattern generation; clocks; SDC files; Synopsys design constraints; at-speed pattern set; at-speed test quality; automatic test pattern generation; clock frequency information; clock scheme; industrial designs; multicycle paths; multicycle-aware at-speed test methodology; multifrequency clock domains; single cycle paths; timing exception paths; transition fault model; Automatic test pattern generation; Circuit faults; Clocks; Delays; Image edge detection; Logic gates; At-speed test; Synopsys Design Constraints (SDC); automatic test pattern generation (ATPG); false paths; multicycle paths; static timing analysis (STA); timing constraints; timing exceptions;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Symposium (ATS), 2013 22nd Asian
  • Conference_Location
    Jiaosi Township
  • ISSN
    1081-7735
  • Type

    conf

  • DOI
    10.1109/ATS.2013.66
  • Filename
    6690613