• DocumentCode
    658535
  • Title

    Design of a Fault-Injectable Fleischer-Laker Switched-Capacitor Biquad for Verifying the Static Linear Behavior Fault Model

  • Author

    Long-Yi Lin ; Hao-Chiao Hong

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Nat. Chiao Tung Univ., Hsinchu, Taiwan
  • fYear
    2013
  • fDate
    18-21 Nov. 2013
  • Firstpage
    62
  • Lastpage
    66
  • Abstract
    This paper presents the design of a fully-differential low-pass SC biquad filter that allows injecting the parametric and catastrophic faults to it. The design is for the verification of the static linear behavior (SLB) fault model which covers multiple parametric and catastrophic analog faults of sampled data systems. The SLB fault model assumes that a circuit under test (CUT) has a fixed z-domain transfer function (TF) template and the faults alter nothing but the coefficients of the TF. To verify this basic assumption, we first retrieve all coefficients of the TF of the fault-injected biquad from the test results of a three-tone test following the diagnosis-after-test (DAT) procedure. Then, we conduct simulations with other stimulus tones and check if the tested responses fit in those predicted by the retrieved TF. Experimental results verify that the fixed TF template assumption holds for all the faults that we injected.
  • Keywords
    fault diagnosis; integrated circuit design; integrated circuit modelling; integrated circuit testing; low-pass filters; sampled data circuits; switched capacitor filters; transfer functions; CUT; DAT procedure; SLB fault model; TF template; catastrophic analog faults; circuit under test; diagnosis-after-test; fault-injectable Fleischer-Laker switched-capacitor biquad; fault-injected biquad; fixed z-domain transfer function; fully-differential low-pass SC biquad filter design; parametric analog faults; sampled data systems; static linear behavior fault model; three-tone test; Analog circuits; Capacitors; Circuit faults; Computational modeling; Frequency estimation; Integrated circuit modeling; Switches; Analog fault model; design for testability; switched capacitor;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Symposium (ATS), 2013 22nd Asian
  • Conference_Location
    Jiaosi Township
  • ISSN
    1081-7735
  • Type

    conf

  • DOI
    10.1109/ATS.2013.20
  • Filename
    6690616