DocumentCode
658543
Title
Automotive EEPROM Qualification and Cost Optimization
Author
Sarson, Peter ; Schatzberger, Gregor ; Seitz, Robert
Author_Institution
ams AG, Unterpremstaetten, Austria
fYear
2013
fDate
18-21 Nov. 2013
Firstpage
105
Lastpage
106
Abstract
This paper is about how an EEPROM characterization test program for the automotive market was developed for an initial IP Block, introduced into production and then cost and yield optimized for high volume production without risk to quality or reliability.
Keywords
EPROM; automotive electronics; integrated circuit testing; production engineering computing; EEPROM characterization test program; automotive EEPROM cost optimization; automotive EEPROM qualification optimization; automotive market; initial IP Block; production test program; Automotive engineering; Computer architecture; EPROM; Microprocessors; Production; Qualifications; Reliability; Automotive; EEPROM; QA; Qulaity; Reliability;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Symposium (ATS), 2013 22nd Asian
Conference_Location
Jiaosi Township
ISSN
1081-7735
Type
conf
DOI
10.1109/ATS.2013.28
Filename
6690624
Link To Document