Title :
Automotive EEPROM Qualification and Cost Optimization
Author :
Sarson, Peter ; Schatzberger, Gregor ; Seitz, Robert
Author_Institution :
ams AG, Unterpremstaetten, Austria
Abstract :
This paper is about how an EEPROM characterization test program for the automotive market was developed for an initial IP Block, introduced into production and then cost and yield optimized for high volume production without risk to quality or reliability.
Keywords :
EPROM; automotive electronics; integrated circuit testing; production engineering computing; EEPROM characterization test program; automotive EEPROM cost optimization; automotive EEPROM qualification optimization; automotive market; initial IP Block; production test program; Automotive engineering; Computer architecture; EPROM; Microprocessors; Production; Qualifications; Reliability; Automotive; EEPROM; QA; Qulaity; Reliability;
Conference_Titel :
Test Symposium (ATS), 2013 22nd Asian
Conference_Location :
Jiaosi Township
DOI :
10.1109/ATS.2013.28
