DocumentCode :
658571
Title :
A Region-Based Framework for Design Feature Identification of Systematic Process Variations
Author :
Shuo-You Hsu ; Chih-Hsiang Hsu ; Ting-Shou Hsu ; Jing-Jia Liou
Author_Institution :
Dept. of Electr. Eng., Nat. TsingHua Univ., Hsinchu, Taiwan
fYear :
2013
fDate :
18-21 Nov. 2013
Firstpage :
265
Lastpage :
270
Abstract :
Process monitoring circuitry such as ring oscillators or delay-test-based diagnosis method has been applied to characterize process variations of a chip. For a design process, it is also desirable to consider circuit features that might cause such a systematic process variation. In this paper, we use the variation map built from measured excessive delays to analyze the correlation between circuits and systematic variations. With support vector regression, a physical map of a circuit is partitioned into different regions that are inherently affected by similar causes. And then possible features (e.g., cell types, layout characteristics, etc.) that influences these regions are ranked. Experimental results show that the proposed method can effectively identify process regions and rank major features at top orders with injected variations.
Keywords :
CMOS integrated circuits; integrated circuit design; integrated circuit testing; oscillators; process monitoring; regression analysis; support vector machines; delay-test-based diagnosis; design feature identification; process monitoring circuitry; process regions; region-based framework; ring oscillators; support vector regression; systematic process variations; variation map; machine learning; process modeling; systematic variation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Symposium (ATS), 2013 22nd Asian
Conference_Location :
Jiaosi Township
ISSN :
1081-7735
Type :
conf
DOI :
10.1109/ATS.2013.56
Filename :
6690652
Link To Document :
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