An Active Test Fixture Approach for 40 Gbps and Above At-Speed Testing Using a Standard ATE System

This paper presents an active test fixture approach for at-speed functional testing of high-speed I/O interfaces with automated test equipment that is able to reach data rates of 40 Gbps and above. At these data rates signal integrity is critical. Because of this we will not only discuss the solution in terms of its instrumentation but also the challenges of getting the signal to the DUT with the needed parametric performance. We will also show some results with a real application running at 40 Gbps.