DocumentCode :
658888
Title :
A 0.18V charge-pumped DFF with 50.8% energy-delay reduction for near-/sub-threshold circuits
Author :
Bo Wang ; Jun Zhou ; Kah Hyong Chang ; Minkyu Je ; Kim, Tony T.
Author_Institution :
Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ., Singapore, Singapore
fYear :
2013
fDate :
11-13 Nov. 2013
Firstpage :
121
Lastpage :
124
Abstract :
This paper presents a 16-transistor charge-pumped DFF featuring a low energy-delay product for near-/sub-threshold applications. The device count of the proposed DFF is minimized by eliminating clock buffer and employing pass gates instead of transmission gates. To reduce the Clock-to-Q delay and improve variation resilience, two charge pumps and an anti-inverse-narrow-width-effect strategy are utilized, improving the performance by 23%. The proposed DFF is fully functional down to 0.18V and shows the energy-delay product of 13.1 pJ·ns at 100% data activity, achieving 51.8% improvement compared to the conventional TGFF. When VDD=0.5V, the energy-delay product is averagely enhanced by 50.8%. Two 256-bit FIFOs are implemented in 180nm CMOS technology using the proposed DFF and TGFF. The FIFO utilizing the charge-pumped DFF exhibits 31.2% total power reduction at subthreshold regime.
Keywords :
CMOS logic circuits; charge pump circuits; flip-flops; CMOS technology; FIFO; anti-inverse-narrow-width-effect strategy; charge pumps; charge-pumped DFF; clock buffer; clock-to-Q delay; energy-delay product; energy-delay reduction; near-/sub-threshold circuits; pass gates; size 180 nm; transmission gates; variation resilience; voltage 0.18 V; voltage 0.5 V; word length 256 bit; Charge pumps; Clocks; Delays; Logic gates; Power measurement; Transistors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Circuits Conference (A-SSCC), 2013 IEEE Asian
Conference_Location :
Singapore
Print_ISBN :
978-1-4799-0277-4
Type :
conf
DOI :
10.1109/ASSCC.2013.6690997
Filename :
6690997
Link To Document :
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