Title :
Continuous Wave Threshold Characteristics of Coupled-Cavity VCSELs: Experiment and Model
Author :
Zujewski, Mateusz ; Frasunkiewicz, Leszek ; Choquette, Kent ; Czyszanowski, T. ; Thienpont, Hugo ; Panajotov, K.
Author_Institution :
Fac. of Eng. Sci., Vrije Univ. Brussel, Brussels, Belgium
Abstract :
We carry out a detailed characterization of continuous wave threshold behavior of coupled-cavity vertical-cavity surface-emitting lasers with various radii of the ion-implantation and oxide apertures. We obtain modal threshold current maps and wavelength at threshold and identify three groups of lasers with qualitatively different behavior, i.e. 1) lasing only on the short, 2) on both short and long and 3) only on the long wavelength fundamental mode. All lasers show profound impact of the current induced self-heating. In order to elucidate this impact, we improve the existing rate equation model by considering nonuniform longitudinal temperature distribution and adding the gain and refractive index temperature dependencies. We are able to reproduce the experimentally observed switchings between different longitudinal modes, as well as all the three different types of modal behavior.
Keywords :
ion implantation; laser cavity resonators; laser modes; optical switches; quantum well lasers; refractive index; surface emitting lasers; temperature distribution; continuous wave threshold characteristics; coupled-cavity VCSEL; coupled-cavity vertical-cavity surface-emitting lasers; current induced self-heating; gain dependence; ion-implantation; longitudinal modes; modal threshold current maps; nonuniform longitudinal temperature distribution; oxide apertures; rate equation model; refractive index temperature dependence; wavelength fundamental mode; Apertures; Cavity resonators; Current measurement; Laser modes; Mathematical model; Measurement by laser beam; Vertical cavity surface emitting lasers; Coupled cavities; VCSEL (vertical-cavity surface-emitting lasers); rate equations;
Journal_Title :
Lightwave Technology, Journal of
DOI :
10.1109/JLT.2013.2287093